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D01 Physico-Chemical Characterization Laboratory – 1/4.1 LCFC


             Head of Laboratory: Dr. Eng., Phys. Delia PĂTROI (from 01.01.2020)
                             Eng. Sorina Adriana MITREA (from 01.04.2019 up to 31.12.2019)
                              E-mail: delia.patroi@icpe-ca.ro
                              Phone: (+40-21)346.72.31 / 133
                              Fax: (+40-21)346.82.99


                             RESEARCH AREAS and ACTIVITY DOMAINS
                •	  research and development of new materials with functional properties for specific applications;
                •	  Investigation of interface phenomena at micro and nano scale for micro and optoelectronics applications;
                •	  Morpho‑structural, mechanical and phisical‑chemical materials characterization by using the following
                    advanced techniques:
                       -   X-ray diffractometry in order to identify the crystalline phase of the solid materials powders or
                    thin films, with the possibility to determine the unit cell parameters (for example: their variation with
                    temperature, the tension of the network, or because of dopants) and crystallite size, as well as the
                    tracking of possible changes of crystalline network in the range of temperature: ‑180°C ÷ +1000°C
                    (in the case of thin films);
                       -   scanning electron microscopy (SEM) which provides viewing and studying of the microscopic
                    structures and surfaces of different materials types (inorganic, organic, conductive or nonconductive,
                    magnetic, under the compact structure, powder or thin films);
                       -   atomic force microscopy (AFM) which allows 3D analysis in the nano and micrometric area of
                    surface topography and detecting the local physical properties such as: electrical resistance, leakage
                    currents, piezoelectric response, magnetization, elasticity; it is also possible to study the morphology
                    and the assessment of roughness degree of thin films from organic and inorganic materials deposited
                    by different methods;
                       -   tunnelling electron microscopy (STM) which allows the study of surface properties from the
                    microscopic to atomic level, on conductive thin films;
                       -   high  resolution  electronic  microscopy  (HRTEM)  which  allows  the  study  of  the  properties
                    and network structures for different materials types (bulk, thin films, wires, powders – all properly
                    processed  up  to  the  electronic  transparency  level),  with  crystalline,  amorphous  or  nano‑crystalline
                    structures;
                       -   determination  of  the  Vickers  and  Knoop  micro‑hardness,  and  of  the  Vickers  and  Brinell
                    hardness for solid metallic, ceramic, carbonic or polymeric materials;
                       -   X-ray fluorescence spectrometry with wavelength dispersion (WD-XRF);
                       -   atomic absorbtion spectrometry (AAS);
                       -   characteristic X-ray energy dispersive spectroscopy (EDS).



            D01 Analysis of the Thermal Behaviour of Products and Materials Laboratory –
            1/4.2 LACTPM


             Head of Laboratory: Dr. Andrei CUCOȘ (from 03.12.2019)
                             Dr. Petru BUDRUGEAC (up to 30.11.2019)
                             E-mail: andrei.cucos@icpe-ca.ro
                             Phone: (+40-21)346.72.31 / 160
                             Fax: (+40-21)346.82.99


                             ACTIVITY DOMAINS
            •  determination of thermal life time of polymeric materials, including electro‑insulating polymeric materials
               and products;
            •  elaboration of specific methods for determining the thermal behaviour of materials and products through
               the following methods of thermal analysis:
                       o   thermogravimetric analysis (TG) coupled with FTIR analysis of resulting gases;
                       o   derivative thermogravimetric analysis (DTG);
                       o   differential thermal analysis (DTA);
                       o   differential scanning calorimetry (DSC);
                       o   dilatometry (DIL);
                       o   thermo‑mechanical analysis (DMA);

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